ere is a new tool to do structural analysis of materials.
Thats called MAUD. MAUD stands for Material Analysis Using Diffraction.
It is a general diffraction/reflectivity analysis program mainly based on the Rietveld method, but not limited to.
MAUD Version 2.26 (4 June 2010)
MAUD Download link: https://www.mediafire...3pw7ppkyrxltsbv
MAUD Video Tutorials: https://www.youtube.c...RietveldProgram
by Luca Lutterotti, 1997-2010
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Maud first lesson: downloading, installing and first run
This lesson will show you the basic steps for downloading, installing and first run of the program. The tutorial contains also some additional hints on plotting and exporting plot images.
Link: AVI or MP4
The main features of MAUD are:
* Written in Java can run on Windows, MacOSX, Linux, Unix (need Java VM 1.5 or later)
* Easy to use, every action is controlled by a GUI
* Works with X-ray, synchrotron, Neutron, TOF
* Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
* Ab-initio structure solution integration, from peak finding, indexing to solving
* Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, ****dynamics)
* Le Bail fitting
* Quantitative phase analysis
* Microstructure analysis (size-strain, anisotropy and distributions included)
* Texture and residual stress analysis using part or full spectra
* MEEM and superflip algorithm for Electron Density Maps and fitting
* Thin film and multilayer aware; film thickness and absorption models
* Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
* Works with TEM diffraction images and electron scattering
* Several data files input formats
* Works and input images from 2D detectors (image plates, CCD)
* CIF compliance for input/output; import structures from databases
* Many other features......look at the Maud in action page.
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2012-10-08, 09:43
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